9. Список литературы

Bergmann, J., Kleeberg, R., Haase, A. & Breidenstein, B. (2000): Advanced Fundamental Parameters Model for Improved Profile Analysis. - Mat. Sci. Forum, 347-349, 303-308.

Brindley, G.W. (1945): The effect of grain or particle size on X-ray reflections from mixed powders and alloys, considered in relation to the quantitative determination of crystalline substances by X-ray methods. - Phil. Mag., 36, 347-369.

Cheary, R.W. & Coelho, A.A. (1998a): Axial divergence in a conventional X-ray powder diffractometer I. Theoretical foundations. - J. Appl. Cryst., 31, 851-861.

Cheary, R.W. & Coelho, A.A. (1998b): Axial divergence in a conventional X-ray powder diffractometer II. Implementation and comparison with experiment. - J. Appl. Cryst., 31, 862-868.

Coelho, A.A. (2000): Whole Profile Structure Solution from Powder Diffraction Data using Simulated Annealing. - J. Appl. Cryst., 33, 899-908.

Coelho, A.A. (2003): Indexing of powder diffraction patterns by iterative use of singular value decomposition. - J. Appl. Cryst., 36, 86-95.

Coelho, A.A. (2007): A charge-flipping algorithm incorporating the tangent formula for solving difficult structures. - Acta Cryst., A36, 400-406.

Coelho, A.A. & Kern, A. (2005): Discussion of the indexing algorithms within TOPAS. - CPD Newsletter, 32, 43-45.

Finger, L.W., Cox, D.E & Jephcoat, A.P. (1994): A correction for powder diffraction peak asymmetry due to axial divergence. - J. Appl. Cryst., 27, 892-900.

Hill, R.J. & Howard, C.J. (1987): Quantitative phase analysis from neutron powder diffraction data using the Rietveld method. - J. Appl. Cryst., 20, pp 467-474.

Le Bail, A., Duroy, H. & Fourquet, J.L. (1988): Ab-initio Structure Determination of LiSbWO6 by X-Ray Powder Diffraction. - Mat. Res. Bull., 23, 447-452.

March, A. (1932): Mathematische Theorie der Regelung nach der Korngestalt bei affiner Deformation. - Z. Krist., 81, 285-297.

Pawley, G.S. (1981): Unit-cell refinement from powder diffraction scans. - J. Appl. Cryst., 14, 357-361

Pitschke, W., Mattern, N. & Hermann, H. (1993): Incorporation of microabsorption corrections in Rietveld analysis. - Powder Diffraction, 8(4), 223-228.

Rietveld, H.M. (1967): Line profiles of neutron powder-diffraction peaks for structure refinement. - Acta Cryst., 22, 151-152.

Rietveld, H.M. (1969): A profile refinement method for nuclear and magnetic structures. - J. Appl. Cryst., 2, 65-71.

Savitzky A. & Golay, M.J.E. (1964): Smoothing and differentiation of data by simplified least squares procedures. - Analytical Chemistry, 36, 1627-1639.

Suortti, P. (1972): Effects of porosity and surface roughness on the x-ray intensity reflected from a powder specimen. - J. Appl. Cryst., 5, 325-331.

1 Peak Phases, hkl Phases and Structures all represent phases and are related to the keywords x_o / d_o, hkl, and str respectively; see the Technical Reference manual.